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Scanning Electron Microscopy (SEM)-JEOL 820

Scanning Electron Microscopy (SEM)

JSM-6610/LV Scanning Electron Microscope

JSM-6610LV

High performance, high resolution tungsten SEM accommodates large samples up to 300mm in dia. and 80mm in height.

  • Mechanically eucentric, motorized 5-axis stage with asynchronous movement.
  • Easy navigation from integrated color picture.
  • Smart settings, multiple live imaging, picture-in-picture and signal mixing, video capture.
  • LV option with multi-element solid state BSE detector.
  • Analytical options include EDS, EBSD, and CL detectors.
  • LaB6 filament optional.
  • Live remote viewing; full remote control std.

Specifications

ResolutionHV mode: 3.0 nm (30kV), 8nm (3kV), 15nm (1kV) LV mode: 4.0 nm (30kV)
Accel. voltage300V to 30 kV
Magnificationx5 to 300,000 (printed as a 128mm x 96mm micrograph)
LV Pressure10 to 270 pA

JEOL 820 Scanning Electron Microscope

JEOL-Scanning-Electron-Microscope

  • 40 Angstrom Resolution at Low KV (0.3 KV)
  • High Resolution Imaging without Sputter Coating

Shear Dimples of failed Shear pin using SEM

Bottom-of-Sample-1-500x

Energy-dispersive X-ray Spectroscopy (EDX): Elemental Analysis

Base-Metal

  • Low Z Element Detection Capability: Including Boron, Carbon, Oxygen, Nitrogen
  • Quantitative Analysis with Standards

Automated feature analysis for multiphase materials such as brake pads, concrete, and fiber reinforced composites.

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Beach Marks

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Fatigue Striations


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Brittle Intergranular

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Overload

Gold and Carbon sputtering chambers for non-conductive materials


SEM Wire Bond Examination and Pull Tests performed in house